Merle, Benoit; Maier-Kiener, Verena; Rupert, Timothy J.; Pharr, George M.
Journal of Materials Research 36 (2021)
Small-scale mechanical characterization is essential for ensuring the service, performance, and lifetime of microscopic components, such as thin films and coatings, electronic sensors, and MEMS (Micro-Electro-Mechanical Systems). The first mechanical measurements on the submicrometer scale were enabled by the development of nanoindentation in the 1980s and early 1990s. From the beginning [1], Journal of Materials Research (JMR) has been the flagship journal for this field. In addition to countless contributed articles, the four previous focus issues published between 1999 and 2012 [2,3,4,5] have strongly contributed to disseminating the latest in method developments and trends in the field. This new focus issue on Advanced Nanomechanical Testing is a unique opportunity to identify and reflect upon the current research trends.
You must be logged in to post a comment.