The Alemnis Standard Assembly (ASA) comes with a custom flange and mounting adapter for installation in any Scanning Electron Microscope (SEM) with a large-enough chamber.
Typical in-situ SEM configuration: the cables from the ASA are routed through a flange to the controller and a laptop PC is provided as well as a SmarAct controller for XYZ displacement.
Typical configuration in Zeiss Gemini SEM: in this example the ASA cables are routed through a flange on the SEM chamber door.
ASA being prepared and used inside a Scanning Electron Microscope (SEM) to test a micropillar produced by Focused Ion Beam (FIB) milling. Quasi-static pillar compression test and a fatigue (cyclic oscillation) test are shown at the end.