We are thrilled to announce that Alemnis, Imina Technologies, NenoVision and point electronic have formed an alliance to jointly provide in-situ characterization tools, solutions and services.
Our alliance is further strengthened by the principal investigator specialized on in-situ techniques, Prof. Dr. Marc-Georg Willinger.
Electron Microscopy (EM) is widely used across different disciplines in research and engineering. Since its early days, EM has advanced amazingly. Nowadays, the users are not limited by imaging and related analysis but can add more techniques, such as AFM, electrical probing, sample manipulation and force sensing. As providers of tools used in-situ in combination with electron microscopy, we decided to form an alliance, bringing our technologies under one umbrella.