Electrical Testing
Please contact Alemnis for specific electrical testing configurations.
Typically, users setup their own configurations for electrical testing. A common setup for in-situ electrical contact resistance would include wires from a conducting indenter (usually tungsten carbide) and from the sample. These wires require additional connectors on the feedthrough flange to pass out of the SEM chamber. For such a setup, we recommend the Indenter Holder Insulating (IHI).
Mechanical-Electrical Probe (MEP)
The Mechanical Electrical Probe (MEP) module enables simultaneous mechanical and electrical testing at the micro- and nanoscale. Developed in collaboration with IMINA, and integrated with the Alemnis Standard Assembly (ASA), it combines precise nanoindentation with high-resolution electrical probing inside a Scanning Electron Microscope (SEM). This allows researchers to study electrical behavior such as conductivity and contact resistance under mechanical load, making it ideal for semiconductor devices, nanoelectronics, and advanced material research.
