Alemnis nano indenter is unique in its intrinsic displacement control mode
About the product
The Alemnis nanoindenter is a compact and versatile instrument that can be integrated with numerous testing and imaging equipment and used in many different set-ups.
The Alemnis nanoindenter is compatible for in-situ use with Scanning Electron Microscopes (SEM), and also for in-air use with for example Synchrotron beamlines or light microscopes.
It is also the only instrument on the market offering true displacement controlled mode which provides unparalleled flexibility, accuracy and true in-situ nanomechanical testing of many materials and in different applications.
The standard nanoindenter is fully retrofittable with upgrade modules for dynamic mechanical testing under high strain rates and testing under extreme temperature conditions.
Primary indentation mode : True displacement
Indentation range: 35 µm
Displacement noise floor : <1nm
Typical drift at room temperature : 5nm/min
Load range: 500mN standard / optional 1.5N
Load noise floor: 4uN / 12uN (measured RMS noise)
Tip to sample alignment range: 26 x 26 mm (x-y), 22 mm (indentation axe) 1.2nm resolution
Indentation tips : Berkovich, Cube Corner, Flat top, Wedge, Spherical, etc. Easily exchangeable
Indentation profile: Operator can freely define any profiles (displacement or load)
Sinus mode: 200 Hz in displacement mode (note: 20Hz closed loop bandwidth)
Input/output boards: Inputs: 50k samples/s, 24bits; outputs: 100k samples/s, 16bits
Type / Use: In Vacuum (SEM, partial vacuum, inert atmosphere) and In Air
High Temperature Module
The High temperature Module has been engineered to minimize the energy put into the system allowing for a fast thermal stabilization and unprecedented long term stability.