Great example of a progressive load scratch test performed on an aluminium-coated semiconductor bonding pad. Normal load 1-24 mN applied on a spherical diamond indenter of radius 10 µm, with lateral speed 500 nm/s. Video speed 15x.
See also high speed hardness mapping of similar bonding pads here
See the Alemnis Automated Large Sample Platform (ALSP) here
Such tests are helping semiconductor manufacturers to optimize the mechanical properties of their bonding pad coatings.